%0 Conference Paper %1 hellebrand2024functional %A Hellebrand, Sybille %A Sadeghi-Kohan, Somayeh %A Wunderlich, Hans-Joachim %B 2024 International Symposium of Electronics Design Automation (ISEDA) %D 2024 %I IEEE %K %P 785 %R 10.1109/ISEDA62518.2024.10617544 %T Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle %@ 979-8-3503-5204-7 and 979-8-3503-5203-0

@inproceedings{hellebrand2024functional, added-at = {2025-04-29T09:41:47.000+0200}, affiliation = {Hellebrand, S (Corresponding Author), Paderborn Univ, D-33098 Paderborn, Germany. Hellebrand, Sybille; Sadeghi-Kohan, Somayeh, Paderborn Univ, D-33098 Paderborn, Germany. Wunderlich, Hans-Joachim, Univ Stuttgart, D-70569 Stuttgart, Germany.}, author = {Hellebrand, Sybille and Sadeghi-Kohan, Somayeh and Wunderlich, Hans-Joachim}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fbe2935379fd2ca774bd5aa06345a689/unibiblio}, booktitle = {2024 International Symposium of Electronics Design Automation (ISEDA)}, doi = {10.1109/ISEDA62518.2024.10617544}, eventdate = {2024-05-10/2024-05-13}, eventtitle = {2nd International Symposium of Electronics Design Automation (ISEDA)}, interhash = {3c065fdbf848d133c51b39441e0d8ced}, intrahash = {fbe2935379fd2ca774bd5aa06345a689}, isbn = {{979-8-3503-5204-7} and {979-8-3503-5203-0}}, keywords = {}, language = {eng}, pages = 785, publisher = {IEEE}, research-areas = {Computer Science; Engineering}, timestamp = {2025-04-29T07:41:47.000+0200}, title = {Functional Safety and Reliability of Interconnects throughout the Silicon Life Cycle}, unique-id = {WOS:001325422100151}, venue = {Xi'an, China}, year = 2024 }