%0 Journal Article %1 journals/mr/PetersenCDDSVBP02 %A Petersen, R. %A Ceuninck, Ward De %A D'Haen, Jan %A D'Olieslaeger, Marc %A Schepper, Luc De %A Vendier, Olivier %A Blanck, Hervé %A Pons, Dominique %D 2002 %J Microelectronics Reliability %K dblp %N 9-11 %P 1359-1363 %T Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#PetersenCDDSVBP02 %V 42

@article{journals/mr/PetersenCDDSVBP02, added-at = {2015-02-04T00:00:00.000+0100}, author = {Petersen, R. and Ceuninck, Ward De and D'Haen, Jan and D'Olieslaeger, Marc and Schepper, Luc De and Vendier, Olivier and Blanck, Hervé and Pons, Dominique}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e88d7fdda9a233ecd3883bc5a3c2f69c/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(02)00149-X}, interhash = {e6fd663efe6830df54b9e425d907d742}, intrahash = {e88d7fdda9a233ecd3883bc5a3c2f69c}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1359-1363}, timestamp = {2016-02-02T02:00:31.000+0100}, title = {Exploring the limits of Arrhenius-based life testing with heterojunction bipolar transistor technology.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#PetersenCDDSVBP02}, volume = 42, year = 2002 }