%0 Journal Article %1 journals/dt/WangCKBMA13 %A Wang, Xingsheng %A Cheng, Binjie %A Kuang, Jente B. %A Brown, Andrew R. %A Millar, Campbell %A Asenov, Asen %D 2013 %J IEEE Design & Test %K dblp %N 6 %P 18-28 %T Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology. %U http://dblp.uni-trier.de/db/journals/dt/dt30.html#WangCKBMA13 %V 30

@article{journals/dt/WangCKBMA13, added-at = {2018-11-19T00:00:00.000+0100}, author = {Wang, Xingsheng and Cheng, Binjie and Kuang, Jente B. and Brown, Andrew R. and Millar, Campbell and Asenov, Asen}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/213dce0efe987735e940421d3c6564084/dblp}, ee = {http://doi.ieeecomputersociety.org/10.1109/MDAT.2013.2266395}, interhash = {cdf2d347ed812256e4719d4ba4a4a2f9}, intrahash = {13dce0efe987735e940421d3c6564084}, journal = {IEEE Design & Test}, keywords = {dblp}, number = 6, pages = {18-28}, timestamp = {2019-09-27T11:22:09.000+0200}, title = {Statistical Variability and Reliability and the Impact on Corresponding 6T-SRAM Cell Design for a 14-nm Node SOI FinFET Technology.}, url = {http://dblp.uni-trier.de/db/journals/dt/dt30.html#WangCKBMA13}, volume = 30, year = 2013 }