%0 Journal Article %1 journals/mr/BychikhinLPPGGS01 %A Bychikhin, Sergey %A Litzenberger, Martin %A Pichler, R. %A Pogany, Dionyz %A Gornik, Erich %A Groos, Gerhard %A Stecher, Matthias %D 2001 %J Microelectronics Reliability %K dblp %N 9-10 %P 1501-1506 %T Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures. %U http://dblp.uni-trier.de/db/journals/mr/mr41.html#BychikhinLPPGGS01 %V 41

@article{journals/mr/BychikhinLPPGGS01, added-at = {2015-02-05T00:00:00.000+0100}, author = {Bychikhin, Sergey and Litzenberger, Martin and Pichler, R. and Pogany, Dionyz and Gornik, Erich and Groos, Gerhard and Stecher, Matthias}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fadcb839387512aa36b5dd18d3e6b43e/dblp}, ee = {http://dx.doi.org/10.1016/S0026-2714(01)00152-4}, interhash = {c4dc8902b45004b611ca807659f59182}, intrahash = {fadcb839387512aa36b5dd18d3e6b43e}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-10}, pages = {1501-1506}, timestamp = {2016-02-02T02:01:46.000+0100}, title = {Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr41.html#BychikhinLPPGGS01}, volume = 41, year = 2001 }