%0 Conference Paper %1 conf/vts/YilmazCT08 %A Yilmaz, Mahmut %A Chakrabarty, Krishnendu %A Tehranipoor, Mohammad %B VTS %D 2008 %I IEEE Computer Society %K dblp %P 233-239 %T Test-Pattern Grading and Pattern Selection for Small-Delay Defects. %U http://dblp.uni-trier.de/db/conf/vts/vts2008.html#YilmazCT08 %@ 978-0-7695-3123-6

@inproceedings{conf/vts/YilmazCT08, added-at = {2014-11-05T00:00:00.000+0100}, author = {Yilmaz, Mahmut and Chakrabarty, Krishnendu and Tehranipoor, Mohammad}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2ddef549b4afaa0277558e638fcf35a63/dblp}, booktitle = {VTS}, crossref = {conf/vts/2008}, ee = {http://doi.ieeecomputersociety.org/10.1109/VTS.2008.32}, interhash = {b605ffa8e836f74671c819e7706c62a3}, intrahash = {ddef549b4afaa0277558e638fcf35a63}, isbn = {978-0-7695-3123-6}, keywords = {dblp}, pages = {233-239}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T13:39:17.000+0100}, title = {Test-Pattern Grading and Pattern Selection for Small-Delay Defects.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2008.html#YilmazCT08}, year = 2008 }