%0 Conference Paper %1 conf/esem/LiuZYLX17 %A Liu, Jinping %A Zhou, Yuming %A Yang, Yibiao %A Lu, Hongmin %A Xu, Baowen %B ESEM %D 2017 %E Bener, Ayse %E Turhan, Burak %E Biffl, Stefan %I IEEE Computer Society %K dblp %P 11-19 %T Code Churn: A Neglected Metric in Effort-Aware Just-in-Time Defect Prediction. %U http://dblp.uni-trier.de/db/conf/esem/esem2017.html#LiuZYLX17 %@ 978-1-5090-4039-1

@inproceedings{conf/esem/LiuZYLX17, added-at = {2019-02-21T00:00:00.000+0100}, author = {Liu, Jinping and Zhou, Yuming and Yang, Yibiao and Lu, Hongmin and Xu, Baowen}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/23910c82f951e7bf2727f483037a6e54a/dblp}, booktitle = {ESEM}, crossref = {conf/esem/2017}, editor = {Bener, Ayse and Turhan, Burak and Biffl, Stefan}, ee = {http://dl.acm.org/citation.cfm?id=3200495}, interhash = {ae5c98c6d8df7bd106cd0553cfb8d644}, intrahash = {3910c82f951e7bf2727f483037a6e54a}, isbn = {978-1-5090-4039-1}, keywords = {dblp}, pages = {11-19}, publisher = {IEEE Computer Society}, timestamp = {2019-09-27T17:09:19.000+0200}, title = {Code Churn: A Neglected Metric in Effort-Aware Just-in-Time Defect Prediction.}, url = {http://dblp.uni-trier.de/db/conf/esem/esem2017.html#LiuZYLX17}, year = 2017 }