%0 Journal Article %1 journals/mj/KojeckyPS06 %A Kojecký, B. %A Papez, V. %A Sámal, D. %D 2006 %J Microelectronics Journal %K dblp %N 3 %P 269-274 %T Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices. %U http://dblp.uni-trier.de/db/journals/mj/mj37.html#KojeckyPS06 %V 37

@article{journals/mj/KojeckyPS06, added-at = {2007-03-25T00:00:00.000+0100}, author = {Kojecký, B. and Papez, V. and Sámal, D.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/215880603f5f7425d66050182942ed767/dblp}, ee = {http://dx.doi.org/10.1016/j.mejo.2005.09.030}, interhash = {ad2033865c7e48d43949c102864ca9e1}, intrahash = {15880603f5f7425d66050182942ed767}, journal = {Microelectronics Journal}, keywords = {dblp}, number = 3, pages = {269-274}, timestamp = {2016-02-02T06:51:52.000+0100}, title = {Conditions of temperature and time instability occurrence of reverse-biased semiconductor power devices.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj37.html#KojeckyPS06}, volume = 37, year = 2006 }