%0 Conference Paper %1 conf/itc/SanyalCYF10 %A Sanyal, Alodeep %A Chakrabarty, Krishnendu %A Yilmaz, Mahmut %A Fujiwara, Hideo %B ITC %D 2010 %E Press, Ron %E Volkerink, Erik H. %I IEEE Computer Society %K dblp %P 625-634 %T RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage. %U http://dblp.uni-trier.de/db/conf/itc/itc2010.html#SanyalCYF10 %@ 978-1-4244-7206-2

@inproceedings{conf/itc/SanyalCYF10, added-at = {2019-02-13T00:00:00.000+0100}, author = {Sanyal, Alodeep and Chakrabarty, Krishnendu and Yilmaz, Mahmut and Fujiwara, Hideo}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26e872f8722ad83ac43e8079857dc02c2/dblp}, booktitle = {ITC}, crossref = {conf/itc/2010}, editor = {Press, Ron and Volkerink, Erik H.}, ee = {http://doi.ieeecomputersociety.org/10.1109/TEST.2010.5699266}, interhash = {aa84f4e490f6a6d7a60c71bcab4c011c}, intrahash = {6e872f8722ad83ac43e8079857dc02c2}, isbn = {978-1-4244-7206-2}, keywords = {dblp}, pages = {625-634}, publisher = {IEEE Computer Society}, timestamp = {2019-09-27T19:28:36.000+0200}, title = {RT-level design-for-testability and expansion of functional test sequences for enhanced defect coverage.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2010.html#SanyalCYF10}, year = 2010 }