%0 Conference Paper %1 weimer2019softswitching %A Weimer, Julian %A Kallfass, Ingmar %B 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) %C Piscataway, NJ %D 2019 %I IEEE %K ubs_10005 ubs_20007 ubs_30076 ubs_40346 unibibliografie wos %P 455-458 %T Soft-Switching Losses in GaN and SiC Power Transistors Based on New Calorimetric Measurements %@ 978-1-7281-0581-9 and 978-1-72810-580-2 and 978-1-72810-579-6

@inproceedings{weimer2019softswitching, added-at = {2021-02-11T16:14:23.000+0100}, address = {Piscataway, NJ}, affiliation = {Weimer, J (Reprint Author), Univ Stuttgart, Inst Robust Power Semicond Syst, Stuttgart, Germany. Weimer, Julian; Kallfass, Ingmar, Univ Stuttgart, Inst Robust Power Semicond Syst, Stuttgart, Germany.}, author = {Weimer, Julian and Kallfass, Ingmar}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/20266d58eef13a4e12ebeb951f57ccd1d/unibiblio}, booktitle = {2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD)}, eventdate = {2019-05-19/2019-05-23}, eventtitle = {31st IEEE International Symposium on Power Semiconductor Devices and ICs (ISPSD), Shanghai, PEOPLES R CHINA, MAY 19-23, 2019}, interhash = {9759e7e3a90f53161e6471490b8beb33}, intrahash = {0266d58eef13a4e12ebeb951f57ccd1d}, isbn = {{978-1-7281-0581-9} and {978-1-72810-580-2} and {978-1-72810-579-6}}, keywords = {ubs_10005 ubs_20007 ubs_30076 ubs_40346 unibibliografie wos}, language = {eng}, pages = {455-458}, publisher = {IEEE}, timestamp = {2021-02-11T15:14:23.000+0100}, title = {Soft-Switching Losses in GaN and SiC Power Transistors Based on New Calorimetric Measurements}, unique-id = {ISI:000484987200112}, venue = {Shanghai, China}, year = 2019 }