%0 Conference Paper %1 conf/isqed/KanjJSKANMN07 %A Kanj, Rouwaida %A Joshi, Rajiv V. %A Sivagnaname, Jayakumaran %A Kuang, Jente B. %A Acharyya, Dhruva %A Nguyen, Tuyet %A McDowell, Chandler %A Nassif, Sani R. %B ISQED %D 2007 %I IEEE Computer Society %K dblp %P 33-40 %T Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2007.html#KanjJSKANMN07 %@ 978-0-7695-2795-6

@inproceedings{conf/isqed/KanjJSKANMN07, added-at = {2014-09-26T00:00:00.000+0200}, author = {Kanj, Rouwaida and Joshi, Rajiv V. and Sivagnaname, Jayakumaran and Kuang, Jente B. and Acharyya, Dhruva and Nguyen, Tuyet and McDowell, Chandler and Nassif, Sani R.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/27ef7ca76bd7ca8da55eb311fecdba039/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2007}, ee = {http://doi.ieeecomputersociety.org/10.1109/ISQED.2007.83}, interhash = {8f393bd95c792a160be0d5bb3971555c}, intrahash = {7ef7ca76bd7ca8da55eb311fecdba039}, isbn = {978-0-7695-2795-6}, keywords = {dblp}, pages = {33-40}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T13:52:55.000+0100}, title = {Gate Leakage Effects on Yield and Design Considerations of PD/SOI SRAM Designs.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2007.html#KanjJSKANMN07}, year = 2007 }