%0 Journal Article %1 journals/tvlsi/ChenO12 %A Chen, Mingjing %A Orailoglu, Alex %D 2012 %J IEEE Trans. VLSI Syst. %K dblp %N 12 %P 2170-2183 %T Scan Power Reduction for Linear Test Compression Schemes Through Seed Selection. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi20.html#ChenO12 %V 20

@article{journals/tvlsi/ChenO12, added-at = {2012-08-21T00:00:00.000+0200}, author = {Chen, Mingjing and Orailoglu, Alex}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e665cfd8a47e9739979fcb6f75538eea/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2011.2173509}, interhash = {8be19a55ce31ed71e7583c8c283a0565}, intrahash = {e665cfd8a47e9739979fcb6f75538eea}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 12, pages = {2170-2183}, timestamp = {2016-02-02T02:13:19.000+0100}, title = {Scan Power Reduction for Linear Test Compression Schemes Through Seed Selection.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi20.html#ChenO12}, volume = 20, year = 2012 }