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Disambiguation of "Chen, Mingjing"

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Scan Power Reduction for Linear Test Compression Schemes Through Seed Selection.

, and . IEEE Trans. VLSI Syst., 20 (12): 2170-2183 (2012)

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Univ. -Prof. Dr. Po Wen Cheng University of Stuttgart

Modeling, testing and application of tuned liquid multi-column dampers for floating offshore wind turbines. Universität Stuttgart, Stuttgart, Dissertation, (2024)

Hong Chen University of Stuttgart

Yiyin Chen University of Stuttgart

Jun Chen University of Stuttgart

Lu Chen University of Stuttgart

 

Other publications of authors with the same name

VDDmin test optimization for overscreening minimization through adaptive scan chain masking., and . VTS, page 313-318. IEEE Computer Society, (2010)On Diagnosis of Timing Failures in Scan Architecture., and . IEEE Trans. on CAD of Integrated Circuits and Systems, 31 (7): 1102-1115 (2012)Scan power reduction in linear test data compression scheme., and . ICCAD, page 78-82. ACM, (2009)Scan Power Reduction for Linear Test Compression Schemes Through Seed Selection., and . IEEE Trans. VLSI Syst., 20 (12): 2170-2183 (2012)Deflecting crosstalk by routing reconsideration through refined signal correlation estimation., and . ACM Great Lakes Symposium on VLSI, page 369-374. ACM, (2009)Cost-effective IR-drop failure identification and yield recovery through a failure-adaptive test scheme., and . DATE, page 63-68. IEEE, (2010)Squashing code size in microcoded IPs while delivering high decompression speed., , and . Design Autom. for Emb. Sys., 14 (3): 265-284 (2010)Examining Timing Path Robustness Under Wide-Bandwidth Power Supply Noise Through Multi-Functional-Cycle Delay Test., and . IEEE Trans. VLSI Syst., 22 (4): 734-746 (2014)Using Weighted Scan Enable Signals to Improve Test Effectiveness of Scan-Based BIST., , and . IEEE Trans. Computers, 56 (12): 1619-1628 (2007)Scan BIST with biased scan test signals., , and . Science in China Series F: Information Sciences, 51 (7): 881-895 (2008)