%0 Conference Paper %1 conf/dac/SwahnH06 %A Swahn, Brian %A Hassoun, Soha %B DAC %D 2006 %E Sentovich, Ellen %I ACM %K dblp %P 528-531 %T Gate sizing: finFETs vs 32nm bulk MOSFETs. %U http://dblp.uni-trier.de/db/conf/dac/dac2006.html#SwahnH06 %@ 1-59593-381-6

@inproceedings{conf/dac/SwahnH06, added-at = {2018-11-06T00:00:00.000+0100}, author = {Swahn, Brian and Hassoun, Soha}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/213acbf3fa6fc16521ff7fcf3e78c4611/dblp}, booktitle = {DAC}, crossref = {conf/dac/2006}, editor = {Sentovich, Ellen}, ee = {https://doi.org/10.1145/1146909.1147047}, interhash = {880b13a3150643842fc28c26ce41a39a}, intrahash = {13acbf3fa6fc16521ff7fcf3e78c4611}, isbn = {1-59593-381-6}, keywords = {dblp}, pages = {528-531}, publisher = {ACM}, timestamp = {2019-09-27T20:18:04.000+0200}, title = {Gate sizing: finFETs vs 32nm bulk MOSFETs.}, url = {http://dblp.uni-trier.de/db/conf/dac/dac2006.html#SwahnH06}, year = 2006 }