%0 Conference Paper %1 conf/vts/WenEMYKKGT11 %A Wen, Xiaoqing %A Enokimoto, Kazunari %A Miyase, Kohei %A Yamato, Yuta %A Kochte, Michael A. %A Kajihara, Seiji %A Girard, Patrick %A Tehranipoor, Mohammad %B VTS %D 2011 %I IEEE Computer Society %K dblp %P 166-171 %T Power-aware test generation with guaranteed launch safety for at-speed scan testing. %U http://dblp.uni-trier.de/db/conf/vts/vts2011.html#WenEMYKKGT11 %@ 978-1-61284-657-6

@inproceedings{conf/vts/WenEMYKKGT11, added-at = {2011-08-09T00:00:00.000+0200}, author = {Wen, Xiaoqing and Enokimoto, Kazunari and Miyase, Kohei and Yamato, Yuta and Kochte, Michael A. and Kajihara, Seiji and Girard, Patrick and Tehranipoor, Mohammad}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2fdcab1c527a065cf8176217c94b2b239/dblp}, booktitle = {VTS}, crossref = {conf/vts/2011}, ee = {http://dx.doi.org/10.1109/VTS.2011.5783778}, interhash = {86908e054d681415c4f052d8f9fb1078}, intrahash = {fdcab1c527a065cf8176217c94b2b239}, isbn = {978-1-61284-657-6}, keywords = {dblp}, pages = {166-171}, publisher = {IEEE Computer Society}, timestamp = {2016-09-07T09:33:54.000+0200}, title = {Power-aware test generation with guaranteed launch safety for at-speed scan testing.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts2011.html#WenEMYKKGT11}, year = 2011 }