%0 Journal Article %1 Schnitzler_APEC2024 %A Schnitzler, R. %A Koch, D %A Weiser, M. %A Weimer, J. %A Kallfass, I %D 2024 %J in Proc. Applied Power Electronics Conference (APEC), Long Beach %K PUMA in update %T Comparison of Gate-Source-Dependent Soft- and Hard-Switching Losses of Wide-Bandgap Semiconductor Utilizing Electrical and Rapid Heatsinkless Calorimetric Measurements

@article{Schnitzler_APEC2024, added-at = {2025-05-26T10:46:09.000+0200}, author = {Schnitzler, R. and Koch, D and Weiser, M. and Weimer, J. and Kallfass, I}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2643d3dd1f1a5b8f7f9f291ce8846f206/ingmarkallfass}, date-added = {2023-12-08 14:16:55 +0100}, date-modified = {2023-12-08 14:17:35 +0100}, interhash = {7023fc9f177b6ad66f4cd91c8321c41d}, intrahash = {643d3dd1f1a5b8f7f9f291ce8846f206}, journal = {in Proc. Applied Power Electronics Conference (APEC), Long Beach}, keywords = {PUMA in update}, month = {Feb.}, timestamp = {2025-05-26T10:46:09.000+0200}, title = {Comparison of Gate-Source-Dependent Soft- and Hard-Switching Losses of Wide-Bandgap Semiconductor Utilizing Electrical and Rapid Heatsinkless Calorimetric Measurements}, year = 2024 }