%0 Journal Article %1 journals/et/SchmidSBGS97 %A Schmid, Ralf %A Schmitt, Reinhold %A Brunner, Matthias %A Gessner, Oliver %A Sturm, Matthias %D 1997 %J J. Electronic Testing %K dblp %N 1-2 %P 55-63 %T Electron Beam Probing - A Solution for MCM Test and Failure Analysis. %U http://dblp.uni-trier.de/db/journals/et/et10.html#SchmidSBGS97 %V 10

@article{journals/et/SchmidSBGS97, added-at = {2019-05-07T00:00:00.000+0200}, author = {Schmid, Ralf and Schmitt, Reinhold and Brunner, Matthias and Gessner, Oliver and Sturm, Matthias}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f841071ed46f4e41c68ed7d1a543f3d1/dblp}, ee = {https://doi.org/10.1023/A:1008270430950}, interhash = {5c741784656aceef8eeb2b5719659f7a}, intrahash = {f841071ed46f4e41c68ed7d1a543f3d1}, journal = {J. Electronic Testing}, keywords = {dblp}, number = {1-2}, pages = {55-63}, timestamp = {2019-09-27T08:45:09.000+0200}, title = {Electron Beam Probing - A Solution for MCM Test and Failure Analysis.}, url = {http://dblp.uni-trier.de/db/journals/et/et10.html#SchmidSBGS97}, volume = 10, year = 1997 }