%0 Conference Paper %1 conf/itc-asia/ChenLCCL17 %A Chen, Po-Hao %A Lee, Chi-Lin %A Chen, Jing-Yu %A Chen, Po-Wei %A Li, James Chien-Mo %B ITC-Asia %D 2017 %I IEEE %K dblp %P 40-45 %T Physical-aware diagnosis of multiple interconnect defects. %U http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#ChenLCCL17 %@ 978-1-5386-3051-8

@inproceedings{conf/itc-asia/ChenLCCL17, added-at = {2019-11-13T00:00:00.000+0100}, author = {Chen, Po-Hao and Lee, Chi-Lin and Chen, Jing-Yu and Chen, Po-Wei and Li, James Chien-Mo}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26dec8d97c2ba81e0217abda10338a036/dblp}, booktitle = {ITC-Asia}, crossref = {conf/itc-asia/2017}, ee = {https://doi.org/10.1109/ITC-ASIA.2017.8097108}, interhash = {3fa68f1fcffb57871d9bf58be0dd4a73}, intrahash = {6dec8d97c2ba81e0217abda10338a036}, isbn = {978-1-5386-3051-8}, keywords = {dblp}, pages = {40-45}, publisher = {IEEE}, timestamp = {2019-11-26T08:05:11.000+0100}, title = {Physical-aware diagnosis of multiple interconnect defects.}, url = {http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2017.html#ChenLCCL17}, year = 2017 }