%0 Conference Paper %1 conf/ets/GurumurthyVAS07 %A Gurumurthy, Sankar %A Vemu, Ramtilak %A Abraham, Jacob A. %A Saab, Daniel G. %B European Test Symposium %D 2007 %I IEEE Computer Society %K dblp %P 173-178 %T Automatic Generation of Instructions to Robustly Test Delay Defects in Processors. %U http://dblp.uni-trier.de/db/conf/ets/ets2007.html#GurumurthyVAS07 %@ 978-0-7695-2827-4

@inproceedings{conf/ets/GurumurthyVAS07, added-at = {2015-08-18T00:00:00.000+0200}, author = {Gurumurthy, Sankar and Vemu, Ramtilak and Abraham, Jacob A. and Saab, Daniel G.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e2f420dbf7cbf3e405c1036a5b063b54/dblp}, booktitle = {European Test Symposium}, crossref = {conf/ets/2007}, ee = {http://doi.ieeecomputersociety.org/10.1109/ETS.2007.13}, interhash = {3a5ea9c8fedd9b4afaf99455c8d3a80c}, intrahash = {e2f420dbf7cbf3e405c1036a5b063b54}, isbn = {978-0-7695-2827-4}, keywords = {dblp}, pages = {173-178}, publisher = {IEEE Computer Society}, timestamp = {2016-02-02T15:20:09.000+0100}, title = {Automatic Generation of Instructions to Robustly Test Delay Defects in Processors.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2007.html#GurumurthyVAS07}, year = 2007 }