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Automatic Generation of Instructions to Robustly Test Delay Defects in Processors.

S. Gurumurthy, R. Vemu, J. Abraham, und D. Saab. European Test Symposium, Seite 173-178. IEEE Computer Society, (2007)

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G. Daiß

G. Wagner

Dr. Guido Reina University of Stuttgart

Daniel Vietz University of Stuttgart

Execution Patterns for Quantum ApplicationsD. Georg, J. Barzen, M. Beisel, F. Leymann, J. Obst, D. Vietz, B. Weder, and V. Yussupov. Proceedings of the 18th International Conference on Software Technologies, page 258-268. Setúbal, SciTePress, (2023)

Daniel Georg University of Stuttgart

Execution Patterns for Quantum ApplicationsD. Georg, J. Barzen, M. Beisel, F. Leymann, J. Obst, D. Vietz, B. Weder, and V. Yussupov. Proceedings of the 18th International Conference on Software Technologies, page 258-268. Setúbal, SciTePress, (2023)

Other publications of authors with the same name

Efficient simulation of switch-level circuits in a hierarchical simulation environment.J. Wehbeh, and D. Saab. Great Lakes Symposium on VLSI, page 231-235. IEEE, (1994)Exact Path Delay Fault Coverage Calculation of Partitioned Circuits.F. Kocan, L. Li, and D. Saab. IEEE Trans. Computers, 58 (6): 858-864 (2009)Recovery Issues in Databases Using Redundant Disk Arrays.A. Mourad, W. Fuchs, and D. Saab. J. Parallel Distrib. Comput., 17 (1-2): 75-89 (1993)Ultralow-Power Reconfigurable Computing with Complementary Nano-Electromechanical Carbon Nanotube Switches.S. Bhunia, M. Tabib-Azar, and D. Saab. ASP-DAC, page 86-91. IEEE Computer Society, (2007)Derivation of signal flow for switch-level simulation.D. Blaauw, D. Saab, J. Long, and J. Abraham. EURO-DAC, page 301-305. IEEE Computer Society, (1990)Case Study of ATPG-based Bounded Model Checking: Verifying USB2.0 IP Core.Q. Qiang, C. Chang, D. Saab, and J. Abraham. ICCD, page 461-463. IEEE Computer Society, (2005)Dynamic Fault Diagnosis of Combinational and Sequential Circuits on Reconfigurable Hardware.F. Kocan, and D. Saab. J. Electronic Testing, 23 (5): 405-420 (2007)Behavioral synthesis for testability.C. Chen, and D. Saab. ICCAD, page 612-615. IEEE Computer Society / ACM, (1992)Portable parallel logic and fault simulation.R. Mueller-Thuns, D. Saab, R. Damiano, and J. Abraham. ICCAD, page 506-509. IEEE Computer Society, (1989)On the Initialization of Sequential Circuits.J. Wehbeh, and D. Saab. ITC, page 233-239. IEEE Computer Society, (1994)