%0 Journal Article %1 journals/et/DattaGSAd08 %A Datta, Ramyanshu %A Gupta, Ravi %A Sebastine, Antony %A Abraham, Jacob A. %A d'Abreu, Manuel A. %D 2008 %J J. Electronic Testing %K dblp %N 5 %P 481-496 %T Controllability of Static CMOS Circuits for Timing Characterization. %U http://dblp.uni-trier.de/db/journals/et/et24.html#DattaGSAd08 %V 24

@article{journals/et/DattaGSAd08, added-at = {2009-03-22T00:00:00.000+0100}, author = {Datta, Ramyanshu and Gupta, Ravi and Sebastine, Antony and Abraham, Jacob A. and d'Abreu, Manuel A.}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2f91b446f9b5c00363c19ff7e0cdc6ad6/dblp}, ee = {http://dx.doi.org/10.1007/s10836-007-5059-6}, interhash = {1c2946cd5cdd60aaefb322767952e66f}, intrahash = {f91b446f9b5c00363c19ff7e0cdc6ad6}, journal = {J. Electronic Testing}, keywords = {dblp}, number = 5, pages = {481-496}, timestamp = {2016-02-02T10:07:23.000+0100}, title = {Controllability of Static CMOS Circuits for Timing Characterization.}, url = {http://dblp.uni-trier.de/db/journals/et/et24.html#DattaGSAd08}, volume = 24, year = 2008 }