%0 Journal Article %1 journals/tvlsi/PengYCT13 %A Peng, Ke %A Yilmaz, Mahmut %A Chakrabarty, Krishnendu %A Tehranipoor, Mohammad %D 2013 %J IEEE Trans. VLSI Syst. %K dblp %N 6 %P 1129-1142 %T Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi21.html#PengYCT13 %V 21

@article{journals/tvlsi/PengYCT13, added-at = {2013-05-27T00:00:00.000+0200}, author = {Peng, Ke and Yilmaz, Mahmut and Chakrabarty, Krishnendu and Tehranipoor, Mohammad}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/26c4acb56d471f7dfdb381b99dd1e3da0/dblp}, ee = {http://dx.doi.org/10.1109/TVLSI.2012.2205026}, interhash = {0049d26683a5181914cf5ab4838e25fb}, intrahash = {6c4acb56d471f7dfdb381b99dd1e3da0}, journal = {IEEE Trans. VLSI Syst.}, keywords = {dblp}, number = 6, pages = {1129-1142}, timestamp = {2016-02-02T02:13:01.000+0100}, title = {Crosstalk- and Process Variations-Aware High-Quality Tests for Small-Delay Defects.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi21.html#PengYCT13}, volume = 21, year = 2013 }