J. Liu, Y. Jeong, T. Ly, Ö. Atmaca, I. Park, and P. Pott. Mikroelektronik / Mikrosystemtechnik und ihre Anwendungen – Nachhaltigkeit und Technologiesouveränität 23. – 25. Oktober 2023, Dresden, page 65-69. VDE, (2023)
C. Bett, K. Frenner, S. Reichelt, and W. Osten. Optical Measurement Systems for Industrial Inspection XIII, 12618, page 126181C. International Society for Optics and Photonics, SPIE, (2023)
T. Haist, F. Lodholz, A. Faulhaber, and S. Reichelt. Automated Visual Inspection and Machine Vision V, 12623, page 126230E. International Society for Optics and Photonics, SPIE, (2023)
S. Amann, T. Haist, A. Gatto, M. Kamm, and S. Reichelt. Digital Optical Technologies 2023, 12624, page 126240M. International Society for Optics and Photonics, SPIE, (2023)
S. Amann, T. Haist, A. Gatto, M. Kamm, and A. Herkommer. Photonic Instrumentation Engineering X, 12428, page 124280G. International Society for Optics and Photonics, SPIE, (2023)
J. Liu, Ö. Atmaca, T. Ly, and P. Pott. Beiträge des 9. GMM-Workshops 21. – 22.11.2022 in Aachen, GMM-Fachbericht 105: Mikro-Nano-Integration, page 90-94. VDE, (2022)
T. Haist, U. Schmid, and W. Osten. VDI BERICHTE, (2007)1 cites: https://scholar.google.com/scholar?cites=10614276875974354744&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, T. Arnold, D. Bui, and .... Forum …, (2014)1 cites: https://scholar.google.com/scholar?cites=10236970921957896968&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, M. Warber, T. Haist, and .... dgao-proceedings. de, (2011)1 cites: https://scholar.google.com/scholar?cites=9039842846502939619&as_sdt=2005&sciodt=0,5&hl=en.
A. Keck, O. Sawodny, M. Gronle, T. Haist, and .... … ASME Transactions on …, (2018)2 cites: https://scholar.google.com/scholar?cites=17262505160804509508&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, L. He, M. Warber, T. Haist, and W. Osten. Proc. der DGaO, (2007)2 cites: https://scholar.google.com/scholar?cites=2224526662259757506&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Gronle, D. Bui, and W. Osten. tm-Technisches Messen, (2015)4 cites: https://scholar.google.com/scholar?cites=8530019438080874564&as_sdt=2005&sciodt=0,5&hl=en.
F. Wurtenberger, T. Haist, C. Reichert, and .... IEEE Transactions …, (2019)1 cites: https://scholar.google.com/scholar?cites=18025495244059991912&as_sdt=2005&sciodt=0,5&hl=en.
H. Tiziani, M. Schönleber, and T. Haist. Optical 3D Measurements, Publisher Gruen, A …, (1997)2 cites: https://scholar.google.com/scholar?cites=17854206010731599739&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. tm Technisches Messen Plattform für Methoden …, (2002)2 cites: https://scholar.google.com/scholar?cites=17178941677927862963&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and H. Tiziani. TECHNISCHES MESSEN, (2002)1 cites: https://scholar.google.com/scholar?cites=13362241692780377838&as_sdt=2005&sciodt=0,5&hl=en.
A. Hermerschmidt, J. Haffner, T. Haist, and .... 2008 IEEE/LEOS …, (2008)1 cites: https://scholar.google.com/scholar?cites=2848751708087726317&as_sdt=2005&sciodt=0,5&hl=en.
S. Dolev, T. Haist, and M. Oltean. Springer, Berlin, (2008)2 cites: https://scholar.google.com/scholar?cites=2579238464927995758&as_sdt=2005&sciodt=0,5&hl=en.
H. Caulfield, S. Dolev, T. Haist, and M. Oltean. Lecture Notes in Comp. Sci, (2008)2 cites: https://scholar.google.com/scholar?cites=5230169121017134821&as_sdt=2005&sciodt=0,5&hl=en.
S. Zwick, M. Warber, W. Gorski, T. Haist, and .... Proceedings …, (2009)2 cites: https://scholar.google.com/scholar?cites=11683331025560310184&as_sdt=2005&sciodt=0,5&hl=en.
A. Burla, T. Haist, W. Lyda, A. Michael, and .... Proc. SPIE, (2010)1 cites: https://scholar.google.com/scholar?cites=12869458722280783790&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, C. Thiel, T. Haist, and .... Proceedings of DGAO …, (2012)1 cites: https://scholar.google.com/scholar?cites=13207528513092743412&as_sdt=2005&sciodt=0,5&hl=en.
C. Lingel, T. Haist, and W. Osten. Laser Beam Shaping XIII, (2012)3 cites: https://scholar.google.com/scholar?cites=8567045848525058300&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, and W. Osten. The Journal of Supercomputing, (2012)1 cites: https://scholar.google.com/scholar?cites=8022635775438100007&as_sdt=2005&sciodt=0,5&hl=en.
S. Dong, T. Haist, W. Osten, T. Ruppel, and .... Proc. SPIE, (2012)2 cites: https://scholar.google.com/scholar?cites=11190995107346479570&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, C. Lingel, W. Osten, K. Bendel, and .... Proc. SPIE, (2013)2 cites: https://scholar.google.com/scholar?cites=3366503478753654556&as_sdt=2005&sciodt=0,5&hl=en.
H. Yang, T. Haist, M. Gronle, and .... Forum Bildverarbeitung …, (2016)2 cites: https://scholar.google.com/scholar?cites=8919893009457312879&as_sdt=2005&sciodt=0,5&hl=en.
S. Gharbi, H. Pang, C. Lingel, T. Haist, and W. Osten. Applied optics, (2017)1 cites: https://scholar.google.com/scholar?cites=7687204403978225625&as_sdt=2005&sciodt=0,5&hl=en.
A. Keck, O. Sawodny, M. Gronle, T. Haist, and W. Osten. IFAC-PapersOnLine, (2016)3 cites: https://scholar.google.com/scholar?cites=2258674658627171137&as_sdt=2005&sciodt=0,5&hl=en.
T. Haist, M. Mann, C. von Sochaczewski, and .... World journal of …, (2017)2 cites: https://scholar.google.com/scholar?cites=1697183833639334004&as_sdt=2005&sciodt=0,5&hl=en.
H. Yang, T. Haist, M. Gronle, and W. Osten. tm-Technisches Messen, (2017)1 cites: https://scholar.google.com/scholar?cites=6641664186600212621&as_sdt=2005&sciodt=0,5&hl=en.
M. Hasler, T. Haist, and W. Osten. Digital Holography and Three …, (2016)2 cites: https://scholar.google.com/scholar?cites=9202048243609368435&as_sdt=2005&sciodt=0,5&hl=en.