%0 Generic %1 Amann2023139 %A Amann, Simon %A Mel, Mazen %A Zanuttigh, Pietro %A Haist, Tobias %A Kamm, Markus %A Gatto, Alexander %D 2023 %E J., Beyerer %E J., Beyerer %E M., Heizmann %E T., Längle %I KIT Scientific Publishing %J Optical Characterization of Materials %K Non-reviewed Paper: Simon_Amann ito myown non-reviewed %P 139 – 148 %T Material Characterization using a Compact Computed Tomography Imaging Spectrometer with Super-resolution Capability %U https://www.scopus.com/inward/record.uri?eid=2-s2.0-85153091087&partnerID=40&md5=64db00a7b4549856dc8e793408638b87 %X Computed Tomography Imaging Spectrometer (CTIS) systems are snapshot hyperspectral imaging devices capable of capturing dense spectra of static as well as dynamic scenes. A three-dimensional hyperspectral cube is smeared across the spatial dimension via Diffractive Optical Element (DOE) and projected across multiple angles forming a two-dimensional compressed sensor image. In this paper we demonstrate material characterization and classification capability of a compact CTIS system leveraging spectral signatures. Then we propose an approach to simultaneously reconstruct and segment into regions corresponding to different materials hyperspectral images with enhanced spatial resolution from CTIS sensor measurements. © 2023, KIT Scientific Publishing. All rights reserved. %@ 978-373151274-5

@conference{Amann2023139, abbrev_source_title = {Opt. Charact. Mater.}, abstract = {Computed Tomography Imaging Spectrometer (CTIS) systems are snapshot hyperspectral imaging devices capable of capturing dense spectra of static as well as dynamic scenes. A three-dimensional hyperspectral cube is smeared across the spatial dimension via Diffractive Optical Element (DOE) and projected across multiple angles forming a two-dimensional compressed sensor image. In this paper we demonstrate material characterization and classification capability of a compact CTIS system leveraging spectral signatures. Then we propose an approach to simultaneously reconstruct and segment into regions corresponding to different materials hyperspectral images with enhanced spatial resolution from CTIS sensor measurements. © 2023, KIT Scientific Publishing. All rights reserved.}, added-at = {2023-06-21T13:49:43.000+0200}, affiliations = {University of Stuttgart, Institut für Technische Optik, Stuttgart, 70569, Germany; University of Padova, Department of Information Engineering, Padova, 35131, Italy; Sony Europe B.V., Stuttgart Technology Center, Stuttgart, 70327, Germany}, author = {Amann, Simon and Mel, Mazen and Zanuttigh, Pietro and Haist, Tobias and Kamm, Markus and Gatto, Alexander}, author_keywords = {CTIS; optical characterization; spectral reconstruction; super resolution}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2b1ab81236e90d467d0427323a4a95f90/simonamann}, editor = {J., Beyerer and J., Beyerer and M., Heizmann and T., Längle}, interhash = {7a41e758fb25b6fa5089aa7d70618009}, intrahash = {b1ab81236e90d467d0427323a4a95f90}, isbn = {978-373151274-5}, issn = {2510-7240}, journal = {Optical Characterization of Materials}, keywords = {Non-reviewed Paper: Simon_Amann ito myown non-reviewed}, language = {English}, pages = {139 – 148}, publication_stage = {Final}, publisher = {KIT Scientific Publishing}, source = {Scopus}, timestamp = {2023-06-21T13:49:43.000+0200}, title = {Material Characterization using a Compact Computed Tomography Imaging Spectrometer with Super-resolution Capability}, type = {Conference paper}, url = {https://www.scopus.com/inward/record.uri?eid=2-s2.0-85153091087&partnerID=40&md5=64db00a7b4549856dc8e793408638b87}, year = 2023 }