PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Chatterjee, Swetaki"

Author of the publication

copydeleteadd this publication to your clipboard
Cross-Layer Reliability Modeling of Dual-Port FeFET : Device-Algorithm Interaction

, , , , and . IEEE transactions on circuits and systems. 1, Fundamental theory and applications, 70 (7): 2891-2903 (2023)
DOI: 10.1109/TCSI.2023.3265427

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Swetaki Chatterjee University of Stuttgart

 

Other publications of authors with the same name

Comprehensive Variability Analysis in Dual-Port FeFET for Reliable Multi-Level-Cell Storage, , , , and . IEEE transactions on electron devices, 69 (9): 5316-5323 (2022)First demonstration of in-memory computing crossbar using multi-level Cell FeFET, , , , , , , , and . Nature communications, (2023)Programmable Delay Element Using Dual-Port FeFET for Post-Silicon Clock Tuning, , and . IEEE electron device letters, 44 (11): 1907-1910 (2023)Nontraditional Design of Dynamic Logics Using FDSOI for Ultra-Efficient Computing, , , , and . IEEE journal on exploratory solid-state computational devices and circuits, 9 (1): 74-82 (2023)Leveraging Ferroelectric Stochasticity and In-Memory Computing for DNN IP Obfuscation, , , , , , and . IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 8 (2): 102-110 (2022)Cross-Layer Reliability Modeling of Dual-Port FeFET : Device-Algorithm Interaction, , , , and . IEEE transactions on circuits and systems. 1, Fundamental theory and applications, 70 (7): 2891-2903 (2023)Modeling and Benchmarking 5nm Ferroelectric FinFET from Room Temperature down to Cryogenic Temperatures, , , , and . 2023 IEEE 23rd International Conference on Nanotechnology (NANO), page 643-648. IEEE, (2023)Cross-layer FeFET Reliability Modeling for Robust Hyperdimensional Computing, , , , , and . 2022 IFIP/IEEE 30th International Conference on Very Large Scale Integration (VLSI-SoC), Piscataway, IEEE, (2022)A Novel Approach to Mitigate Power Side-Channel Attacks for Emerging Negative Capacitance Transistor Technology, , , , and . 2022 20th IEEE Interregional NEWCAS Conference (NEWCAS), page 504-508. Piscataway, IEEE, (2022)Ferroelectric FDSOI FET modeling for memory and logic applications, , , , , and . Solid state electronics, 200 (February): 108554 (2023)