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An Effective BIST Scheme for ROM's., and . IEEE Trans. Computers, 41 (5): 646-653 (1992)Programmable BIST Space Compactors., , and . IEEE Trans. Computers, 45 (12): 1393-1404 (1996)Guest Editor's Introduction: Advances in Infrastructure IP.. IEEE Design & Test of Computers, 20 (3): 49- (2003)Design & Test Education in Asia., , , , , and . IEEE Design & Test of Computers, 21 (4): 331-338 (2004)A D&T Roundtable: Testing Mixed Logic and DRAM Chips., , , , , , , and . IEEE Design & Test of Computers, 15 (2): 86-92 (1998)Guest Editors' Introduction: East Meets West., and . IEEE Design & Test of Computers, 13 (1): 5-7 (1996)Guest Editorial: Special Issue on Testing of 3D Stacked Integrated Circuits., and . J. Electronic Testing, 28 (1): 13-14 (2012)On IEEE P1500's Standard for Embedded Core Test., , , , , and . J. Electronic Testing, 18 (4-5): 365-383 (2002)Minimal March Tests for Detection of Dynamic Faults in Random Access Memories., , and . J. Electronic Testing, 23 (1): 55-74 (2007)Effective march algorithms for testing single-order addressed memories., and . J. Electronic Testing, 5 (4): 337-345 (1994)