Author of the publication

Capacitively coupled non-contact probing circuits for membrane-based wafer-level simultaneous testing.

, , , , , , , , , , and . ISSCC, page 144-145. IEEE, (2010)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Nakata, Yoshiro
add a person with the name Nakata, Yoshiro
 

Other publications of authors with the same name