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Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.

, , , , , and . Microelectronics Reliability, 46 (9-11): 1514-1519 (2006)

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Theoretical Investigation of an Equivalent Laser LET., , , , and . Microelectronics Reliability, 41 (9-10): 1513-1518 (2001)Low-cost backside laser test method to pre-characterize the COTS IC's sensitivity to Single Event Effects., , , , , and . Microelectronics Reliability, 43 (9-11): 1615-1619 (2003)Design, integration and characterization of analog integrated circuits: a complete design flow dedicated to microelectronics education., , , , , and . MSE, page 75-76. IEEE Computer Society, (1997)Investigation of SEU sensitivity of Xilinx Virtex II FPGA by pulsed laser fault injections., , , , , and . Microelectronics Reliability, 44 (9-11): 1709-1714 (2004)Hierarchical Analogue Design and Behavioural Modelling., , , , , , and . MSE, page 59-60. IEEE Computer Society, (1999)A New Laser System for X-Rays Flashes Sensitivity Evaluation., , , , , , and . IOLTW, page 111-. IEEE Computer Society, (2001)Dynamic Testing of an SRAM-Based FPGA by Time-Resolved Laser Fault Injection., , , , , , and . IOLTS, page 295-301. IEEE Computer Society, (2008)Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study., , , and . IEEE Trans. Instrumentation and Measurement, 48 (5): 932-938 (1999)Characterization of ESD induced defects using Photovoltaic Laser Stimulation (PLS)., , , , and . Microelectronics Reliability, 43 (9-11): 1577-1582 (2003)Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation., , , , , and . Microelectronics Reliability, 46 (9-11): 1514-1519 (2006)