Author of the publication

Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation.

, , , , , and . Microelectronics Reliability, 46 (9-11): 1514-1519 (2006)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

No persons found for author name Lewis, Dean
add a person with the name Lewis, Dean
 

Other publications of authors with the same name

Study of the ESD defects impact on ICs reliability., , , , , , , , and . Microelectronics Reliability, 44 (9-11): 1811-1815 (2004)Backside Hot Spot Detection Using Liquid Crystal Microscopy., , , , , , , and . Microelectronics Reliability, 42 (9-11): 1741-1746 (2002)Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation., , , , , , and . Microelectronics Reliability, 41 (9-10): 1539-1544 (2001)Light Emission to Time Resolved Emission For IC Debug and Failure Analysis., , , , , , and . Microelectronics Reliability, 45 (9-11): 1476-1481 (2005)From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing., , , , , , and . Microelectronics Reliability, 43 (9-11): 1681-1686 (2003)NIR laser stimulation for dynamic timing analysis., , , , , , and . Microelectronics Reliability, 45 (9-11): 1459-1464 (2005)Theoretical Investigation of an Equivalent Laser LET., , , , and . Microelectronics Reliability, 41 (9-10): 1513-1518 (2001)Magnetic field spatial Fourier analysis: A new opportunity for high resolution current localization., , , , and . Microelectronics Reliability, 51 (9-11): 1684-1688 (2011)Building the electrical model of the Photoelectric Laser Stimulation of a PMOS transistor in 90 nm technology., , , , , , , , , and . Microelectron. Reliab., 52 (9-10): 2035-2038 (2012)A comprehensive study of the application of the EOP techniques on bipolar devices., , , , , , and . Microelectronics Reliability, 54 (9-10): 2088-2092 (2014)