PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Lai, Liyang"

Author of the publication

copydeleteadd this publication to your clipboard
Logic BIST Using Constrained Scan Cells.

, , , and . VTS, page 199-205. IEEE Computer Society, (2004)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Rafael Antonio Lainez Reyes University of Stuttgart

Robin Laidig University of Stuttgart

 

Other publications of authors with the same name

Diagnosis and Layout Aware (DLA) Scan Chain Stitching., , , , , , , , , and 5 other author(s). IEEE Trans. VLSI Syst., 23 (3): 466-479 (2015)STDF Memory Fail Datalog Standard., , , , , , , , , and . VTS, page 209-214. IEEE Computer Society, (2009)Logic BIST with Scan Chain Segmentation., , , and . ITC, page 57-66. IEEE Computer Society, (2004)Detection and Diagnosis of Static Scan Cell Internal Defect., , , and . ITC, page 1-10. IEEE Computer Society, (2008)Signature Based Diagnosis for Logic BIST., , , , and . ITC, page 1-9. IEEE Computer Society, (2006)Logic BIST Using Constrained Scan Cells., , , and . VTS, page 199-205. IEEE Computer Society, (2004)Hardware Ef.cient LBISTWith Complementary Weights., , , and . ICCD, page 479-484. IEEE Computer Society, (2005)X-Tolerant Compactor with On-Chip Registration and Signature-Based Diagnosis., , , , , , , and . IEEE Design & Test of Computers, 24 (5): 476-485 (2007)Diagnosis and Layout Aware (DLA) scan chain stitching., , , , , , , , , and 5 other author(s). ITC, page 1-10. IEEE Computer Society, (2013)