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A 14 nm SoC platform technology featuring 2nd generation Tri-Gate transistors, 70 nm gate pitch, 52 nm metal pitch, and 0.0499 um2 SRAM cells, optimized for low power, high performance and high density SoC products., , , , , , , , , and 24 other author(s). VLSIC, page 12-. IEEE, (2015)Transistor reliability variation correlation to threshold voltage., , , , , and . IRPS, page 3. IEEE, (2015)From short-term memory to semantics-a computational model., and . Neural Computing and Applications, 13 (2): 157-167 (2004)On minimal set of test nodes for fault dictionary of analog circuit fault diagnosis., and . J. Electronic Testing, 7 (3): 255-258 (1995)On Parallel Prefix Computation., , and . Parallel Processing Letters, (1994)On Boolean Techniques for Non Touching Loops of Signal Flow Graphs.. CSSP, 32 (3): 1443-1453 (2013)Human protein reference database as a discovery resource for proteomics., , , , , , , , , and 23 other author(s). Nucleic Acids Research, 32 (Database-Issue): 497-501 (2004)Selection of test nodes for analog fault diagnosis in dictionary approach., and . IEEE Trans. Instrumentation and Measurement, 49 (6): 1289-1297 (2000)A System for Incremental Synthesis to Gate-Level and Reoptimization Following RTL Design Changes., , and . DAC, page 441-446. ACM Press, (1994)Radial Basis Function Networks for Analog Circuit Fault Isolation., and . Journal of Circuits, Systems, and Computers, 7 (6): 643- (1997)