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Charging-Effects in RF capacitive switches influence of insulating layers composition., , , , , , and . Microelectronics Reliability, 46 (9-11): 1700-1704 (2006)FPGA Based High Date Rate Radio Interfaces for Aerospace Wireless Sensor Systems., , and . ICONS, page 173-178. IEEE Computer Society, (2009)Medium Access Control for Wireless Sensor Networks based on Impulse Radio Ultra Wideband, , , and . CoRR, (2010)Radio Interface for High Data Rate Wireless Sensor Networks, , , and . CoRR, (2010)Reduced size high performance transformer balun at 60 GHz in CMOS 65 nm technology., , and . Microelectronics Journal, 43 (11): 737-744 (2012)Capacitive RF MEMS analytical predictive reliability and lifetime characterization., , , , , , and . Microelectronics Reliability, 49 (9-11): 1304-1308 (2009)Assessment of dielectric charging in electrostatically driven MEMS devices: A comparison of available characterization techniques., , , , , , and . Microelectronics Reliability, 50 (9-11): 1615-1620 (2010)Methods to improve reliability of bulge test technique to extract mechanical properties of thin films., , , , and . Microelectronics Reliability, 50 (9-11): 1888-1893 (2010)Voltage and temperature effect on dielectric charging for RF-MEMS capacitive switches reliability investigation., , , , , , , , and . Microelectronics Reliability, 48 (8-9): 1248-1252 (2008)High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's., , , , , and . Microelectronics Reliability, 43 (9-11): 1719-1723 (2003)