%0 Journal Article %1 journals/mr/MatmatCMPEFE09 %A Matmat, Mohamed %A Coccetti, Fabio %A Marty, Antoine %A Plana, Robert %A Escriba, Christophe %A Fourniols, Jean-Yves %A Estève, Daniel %D 2009 %J Microelectronics Reliability %K dblp %N 9-11 %P 1304-1308 %T Capacitive RF MEMS analytical predictive reliability and lifetime characterization. %U http://dblp.uni-trier.de/db/journals/mr/mr49.html#MatmatCMPEFE09 %V 49

@article{journals/mr/MatmatCMPEFE09, added-at = {2010-09-28T00:00:00.000+0200}, author = {Matmat, Mohamed and Coccetti, Fabio and Marty, Antoine and Plana, Robert and Escriba, Christophe and Fourniols, Jean-Yves and Estève, Daniel}, biburl = {https://puma.ub.uni-stuttgart.de/bibtex/2e7fe0f1fe931c1d0d0cc6541f39776f7/dblp}, ee = {http://dx.doi.org/10.1016/j.microrel.2009.06.049}, interhash = {0680b520ac30dbbe3d4bbc4bb8eac196}, intrahash = {e7fe0f1fe931c1d0d0cc6541f39776f7}, journal = {Microelectronics Reliability}, keywords = {dblp}, number = {9-11}, pages = {1304-1308}, timestamp = {2016-02-02T02:01:31.000+0100}, title = {Capacitive RF MEMS analytical predictive reliability and lifetime characterization.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr49.html#MatmatCMPEFE09}, volume = 49, year = 2009 }