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Maximum sequence test pattern generators with irreducible characteristic polynomials., , and . Microprocessors and Microsystems, 30 (2): 117-123 (2006)Deterministic Built-in TPG with Segmented FSMs., , and . IOLTS, page 261-266. IEEE Computer Society, (2008)A multi-index ROC-based methodology for high throughput experiments in gene discovery., and . IJDMB, 8 (1): 42-65 (2013)Built-In TPG with Designed Phaseshifts.. VTS, page 365-370. IEEE Computer Society, (2003)Transistor-Level Synthesis for Low-Power Applications., and . ISQED, page 607-612. IEEE Computer Society, (2007)Classifying Performance Bottlenecks in Multi-threaded Applications., , and . MCSoC, page 341-345. IEEE, (2014)Using a WLFSR to Embed Test Pattern Pairs in Minimum Time., and . IOLTW, page 75-79. IEEE Computer Society, (2001)A similarity transform for linear finite state machines.. Discrete Applied Mathematics, 154 (11): 1570-1577 (2006)DV-TSE: Difference Vector Based Test Set Embedding., , , and . VLSI-SOC, page 343-. Technische Universität Darmstadt, Insitute of Microelectronic Systems, (2003)LFSR Characteristic Polynomials for Pseudo-Exhaustive TPG with Low Number of Seeds., and . J. Electronic Testing, 19 (3): 233-244 (2003)