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Disambiguation of "Kobayashi, Kazutoshi"

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A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment.

, , , , and . J. Electron. Test., 37 (5): 675-684 (2021)

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A functional memory type parallel processor for vector quantization., , , , and . ASP-DAC, page 665-666. IEEE, (1997)A Comprehensive Simulation and Test Environment for Prototype VLSI Verification., and . IEICE Transactions, 87-D (3): 630-636 (2004)Evaluation of FPGA design guardband caused by inhomogeneous NBTI degradation considering process variations., and . FPT, page 417-420. IEEE, (2010)Real time low bit-rate video coding algorithm using multi-stage hierarchical vector quantization., , , and . ICASSP, page 2673-2676. IEEE, (1998)Negative bias temperature instability caused by plasma induced damage in 65 nm bulk and Silicon on thin BOX (SOTB) processes., , and . IRPS, page 2. IEEE, (2015)Performance optimization by track swapping on critical paths utilizing random variations for FPGAS., , , and . FPL, page 503-506. IEEE, (2008)A Yield and Speed Enhancement Technique Using Reconfigurable Devices Against Within-Die Variations on the Nanometer Regime., , , , , , and . FPL, page 1-4. IEEE, (2006)Correlations between BTI-Induced Degradations and Process Variations on ASICs and FPGAs., , and . IEICE Transactions, 97-A (12): 2367-2372 (2014)Characterizing SRAM and FF soft error rates with measurement and simulation., , , , and . Integration, (2019)A Bit-Error Rate Measurement and Error Analysis of Wireline Data Transmission using Current Source Model for Single Event Effect under Irradiation Environment., , , , and . J. Electron. Test., 37 (5): 675-684 (2021)