Author of the publication

The impact of device width on the variability of post-irradiation leakage currents in 90 and 65 nm CMOS technologies.

, , , , , and . Microelectronics Reliability, 52 (11): 2521-2526 (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name