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A Unified Framework for Design Validation and Manufacturing Test., , and . ITC, page 875-884. IEEE Computer Society, (1996)Automated mapping of pre-computed module-level test sequences to processor instructions., , and . ITC, page 10. IEEE Computer Society, (2005)Verifying Properties Using Sequential ATPG., , and . ITC, page 194-202. IEEE Computer Society, (2002)Design of Test Pattern Generators for Built-In Test., , and . ITC, page 315-319. IEEE Computer Society, (1984)A fast, accurate and simple critical path monitor for improving energy-delay product in DVS systems., and . ISLPED, page 391-396. IEEE/ACM, (2011)Hierarchical Specification of System Behavior., and . HASE, page 134-140. IEEE Computer Society, (1997)Dependable Embedded Systems Special Day Panel: Issues and Challenges in Dependable Embedded Systems., , , , , and . DATE, page 1394-1395. ACM, (2008)Efficient soft error vulnerability estimation of complex designs., , , and . DATE, page 103-108. ACM, (2015)System accuracy estimation of SRAM-based device authentication., , and . ASP-DAC, page 37-42. IEEE, (2011)A low latency and low power dynamic Carry Save Adder., , , , , , , and . ISCAS (2), page 477-480. IEEE, (2004)