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A Unified Framework for Design Validation and Manufacturing Test.

, , and . ITC, page 875-884. IEEE Computer Society, (1996)

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Abstraction Techniques for Validation Coverage Analysis and Test Generation., , and . IEEE Trans. Computers, 47 (1): 2-14 (1998)Abstraction of data path registers for multilevel verification of large circuits., , , and . Great Lakes Symposium on VLSI, page 11-14. IEEE, (1994)A Unified Framework for Design Validation and Manufacturing Test., , and . ITC, page 875-884. IEEE Computer Society, (1996)Verification of Circuits Described in VHDL through Extraction of Design Intent., , , and . VLSI Design, page 417-420. IEEE Computer Society, (1994)Coverage Estimation for Symbolic Model Checking., , , and . DAC, page 300-305. ACM Press, (1999)Automated verification of temporal properties specified as state machines in VHDL., , and . Great Lakes Symposium on VLSI, page 100-105. IEEE Computer Society, (1995)Probabilistic Evaluation of On-Line Checks in Fault-Tolerant Multiprocessor Systems., , and . IEEE Trans. Computers, 41 (5): 532-541 (1992)Automatic verification of implementations of large circuits against HDL specifications., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 16 (3): 217-228 (1997)Verification of transient response of linear analog circuits., , and . VTS, page 42-47. IEEE Computer Society, (1995)Guest Editors' Introduction: Tackling Key Problems in NoCs., , and . IEEE Design & Test of Computers, 25 (5): 400-401 (2008)