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A 2T1C Embedded DRAM Macro With No Boosted Supplies Featuring a 7T SRAM Based Repair and a Cell Storage Monitor.

, , , and . J. Solid-State Circuits, 47 (10): 2517-2526 (2012)

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Fault-tolerant ripple-carry binary adder using partial triple modular redundancy (PTMR)., , and . ISCAS, page 41-44. IEEE, (2015)Guest editors' introduction: Nanoscale Memories Pose Unique Challenges., and . IEEE Design & Test of Computers, 28 (1): 6-8 (2011)A logic-compatible embedded flash memory featuring a multi-story high voltage switch and a selective refresh scheme., , and . VLSIC, page 130-131. IEEE, (2012)TFT-LCD Application Specific Low Power SRAM Using Charge-Recycling Technique., , and . ISQED, page 59-64. IEEE Computer Society, (2005)Reliable PUF-Based Local Authentication With Self-Correction., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 36 (2): 201-213 (2017)Silicon Odometer: An On-Chip Reliability Monitor for Measuring Frequency Degradation of Digital Circuits., , and . J. Solid-State Circuits, 43 (4): 874-880 (2008)Leakage Power Analysis and Reduction for Nanoscale Circuits., , , , and . IEEE Micro, 26 (2): 68-80 (2006)A Counter based ADC Non-linearity Measurement Circuit and Its Application to Reliability Testing., , , , , and . CICC, page 1-4. IEEE, (2019)Predicting Soft-Response of MUX PUFs via Logistic Regression of Total Delay Difference., , , and . ISCAS, page 1-5. IEEE, (2018)Soft Response Generation and Thresholding Strategies for Linear and Feed-Forward MUX PUFs., , , , and . ISLPED, page 124-129. ACM, (2016)