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A new framework for generating optimal March tests for memory arrays.

, , and . ITC, page 73-82. IEEE Computer Society, (1998)

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Self test architecture for testing complex memory structures., , , and . ITC, page 547-556. IEEE Computer Society, (2000)Programmable Memory BIST and a New Synthesis Framework., and . FTCS, page 352-355. IEEE Computer Society, (1999)The P1500 DFT Disclosure Document: A Standard to Communicate Mergeable Core DFT Data., , , , , and . ITC, page 998-1007. IEEE Computer Society, (2003)Automatic Generation and Validation of Memory Test Models for High Performance Microprocessors., , and . ICCD, page 526-529. IEEE Computer Society, (2001)A Design For Test Perspective on I/O Management., , , and . ICCD, page 46-53. IEEE Computer Society, (1996)A new framework for generating optimal March tests for memory arrays., , and . ITC, page 73-82. IEEE Computer Society, (1998)Design and analysis of multiple weight linear compactors of responses containing unknown values., , , and . ITC, page 10. IEEE Computer Society, (2005)A New Framework For Automatic Generation, Insertion and Verification of Memory Built-In Self Test Units., and . VTS, page 391-397. IEEE Computer Society, (1999)Feedback based droop mitigation., , , and . DATE, page 879-882. IEEE, (2011)Defect Analysis and Realistic Fault Model Extensions for Static Random Access Memories., , and . MTDT, page 119-124. IEEE Computer Society, (2000)