PUMA

academical publication management
collect, organize, and share publications

( en | de )

 

Disambiguation of "Chakradhar, Srimat T."

Author of the publication

copydeleteadd this publication to your clipboard
Scheduling Concurrent Applications on a Cluster of CPU-GPU Nodes.

, , , , and . CCGRID, page 140-147. IEEE Computer Society, (2012)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

T. Ertl

T. Vietor

T. Maier

T. Maier

T. Maier

 

Other publications of authors with the same name

Sequential Circuits with combinational Test Generation Complexity., and . VLSI Design, page 111-117. IEEE Computer Society, (1996)HERMES: A Software Architecture for Visibility and Control in Wireless Sensor Network Deployments., , , , and . IPSN, page 395-406. IEEE Computer Society, (2008)Scheduling Concurrent Applications on a Cluster of CPU-GPU Nodes., , , , and . CCGRID, page 140-147. IEEE Computer Society, (2012)Coverage loss by using space compactors in presence of unknown values., , , , and . DATE, page 1053-1054. European Design and Automation Association, Leuven, Belgium, (2006)Partitioning and Reordering Techniques for Static Test Sequence Compaction of Sequential Circuits., and . Asian Test Symposium, page 452-457. IEEE Computer Society, (1998)Signal Transition Graph Transformations for Initializability., , , and . EDAC-ETC-EUROASIC, page 670. IEEE Computer Society, (1994)ChiYun Compact: A Novel Test Compaction Technique for Responses with Unknown Values., , , and . ICCD, page 147-152. IEEE Computer Society, (2005)Performance Analysis of Synchronized Iterative Algorithms on Multiprocessor Systems., and . IEEE Trans. Parallel Distrib. Syst., 3 (6): 739-746 (1992)Finite state machine synthesis with fault tolerant test function., , and . J. Electronic Testing, 4 (1): 57-69 (1993)An exact algorithm for selecting partial scan flip-flops., , and . J. Electronic Testing, 7 (1-2): 83-93 (1995)