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Coverage loss by using space compactors in presence of unknown values.

M. Chao, S. Wang, S. Chakradhar, W. Wei, and K. Cheng. DATE, page 1053-1054. European Design and Automation Association, Leuven, Belgium, (2006)

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Wei Yu University of Stuttgart

Li-Wei Chen University of Stuttgart

Daniel Weiskopf

Stefanie Weidner

Stefanie Weidner

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A Low Overhead High Test Compression Technique Using Pattern Clustering With $n$-Detection Test Support.S. Wang, W. Wei, and Z. Wang. IEEE Trans. VLSI Syst., 18 (12): 1672-1685 (2010)Coverage loss by using space compactors in presence of unknown values.M. Chao, S. Wang, S. Chakradhar, W. Wei, and K. Cheng. DATE, page 1053-1054. European Design and Automation Association, Leuven, Belgium, (2006)An Efficient Unknown BlockingScheme for Low Control Data Volume and High Observability.S. Wang, and W. Wei. IEEE Trans. on CAD of Integrated Circuits and Systems, 27 (11): 2039-2052 (2008)Unknown-tolerance analysis and test-quality control for test response compaction using space compactors.M. Chao, K. Cheng, S. Wang, S. Chakradhar, and W. Wei. DAC, page 1083-1088. ACM, (2006)A Technique to Reduce Peak Current and Average Power Dissipation in Scan Designs by Limited Capture.S. Wang, and W. Wei. ASP-DAC, page 810-816. IEEE Computer Society, (2007)X-Block: An Efficient LFSR Reseeding-Based Method to Block Unknowns for Temporal Compactors.S. Wang, K. Balakrishnan, and W. Wei. IEEE Trans. Computers, 57 (7): 978-989 (2008)Cost Efficient Methods to Improve Performance of Broadcast Scan.S. Wang, and W. Wei. ATS, page 163-169. IEEE Computer Society, (2008)Machine learning-based volume diagnosis.S. Wang, and W. Wei. DATE, page 902-905. IEEE, (2009)Unknown blocking scheme for low control data volume and high observability.S. Wang, W. Wei, and S. Chakradhar. DATE, page 33-38. EDA Consortium, San Jose, CA, USA, (2007)A low cost test data compression technique for high n-detection fault coverage.S. Wang, Z. Wang, W. Wei, and S. Chakradhar. ITC, page 1-10. IEEE Computer Society, (2007)