Author of the publication

Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices.

, , , , , , , , and . Microelectronics Reliability, 54 (12): 2656-2661 (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Critical factors influencing the voltage robustness of AlGaN/GaN HEMTs., , , , , , and . Microelectronics Reliability, 51 (2): 224-228 (2011)Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications., , , , , , , , and . Microelectronics Reliability, (2017)Active and fast charge-state switching of single NV centres in diamond by in-plane Al-Schottky junctions, , , , , , , , , and 1 other author(s). Beilstein journal of nanotechnology, (2016)QReal DSM platform - An Environment for Creation of Specific Visual IDEs., , , , and . ENASE, page 205-211. SciTePress, (2013)An Approach to Semantic Natural Language Processing of Russian Texts., , , , and . Research in Computing Science, (2013)Influence of surface states on the voltage robustness of AlGaN/GaN HFET power devices., , , , , , , , and . Microelectronics Reliability, 54 (12): 2656-2661 (2014)High-voltage stress time-dependent dispersion effects in AlGaN/GaN HEMTs., , , , , , , , and . IRPS, page 2. IEEE, (2015)