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%0 Journal Article
%1 journals/mr/DammannBPBKQMGS17
%A Dammann, Maximilian
%A Baeumler, M.
%A Polyakov, Vladimir
%A Brückner, P.
%A Konstanzer, H.
%A Quay, Rüdiger
%A Mikulla, Michael
%A Graff, Andreas
%A Simon-Najasek, Michél
%D 2017
%J Microelectronics Reliability
%K dblp
%P 292-297
%T Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications.
%U http://dblp.uni-trier.de/db/journals/mr/mr76.html#DammannBPBKQMGS17
%V 76-77
@article{journals/mr/DammannBPBKQMGS17,
added-at = {2019-06-30T00:00:00.000+0200},
author = {Dammann, Maximilian and Baeumler, M. and Polyakov, Vladimir and Brückner, P. and Konstanzer, H. and Quay, Rüdiger and Mikulla, Michael and Graff, Andreas and Simon-Najasek, Michél},
biburl = {https://puma.ub.uni-stuttgart.de/bibtex/262ada8b23ee38a7035e38be2f49d4c3a/dblp},
ee = {https://doi.org/10.1016/j.microrel.2017.07.008},
interhash = {c296282b1e43f194dd3516647ccf8a30},
intrahash = {62ada8b23ee38a7035e38be2f49d4c3a},
journal = {Microelectronics Reliability},
keywords = {dblp},
pages = {292-297},
timestamp = {2019-09-27T10:58:08.000+0200},
title = {Reliability of 100 nm AlGaN/GaN HEMTs for mm-wave applications.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#DammannBPBKQMGS17},
volume = {76-77},
year = 2017
}