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Disambiguation of "Reddy, Sudhakar M."

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Embedded Tutorial ET2: Volume Diagnosis for Yield Improvement.

, and . VLSI Design, page 21-23. IEEE Computer Society, (2015)

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M. Nudischer

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M. Christmann

 

Other publications of authors with the same name

Hazard-Based Detection Conditions for Improved Transition Fault Coverage of Functional Test Sequences., and . DFT, page 358-366. IEEE Computer Society, (2009)On-chip Generation of the Second Primary Input Vectors of Broadside Tests., and . DFT, page 38-46. IEEE Computer Society, (2009)Diagnosis of Multiple Faults Based on Fault-Tuple Equivalence Tree., , , , and . DFT, page 217-225. IEEE Computer Society, (2011)Test Generation for Open Defects in CMOS Circuits., , , , and . DFT, page 41-49. IEEE Computer Society, (2006)Location of Stuck-At Faults and Bridging Faults Based on Circuit Partitioning., and . IEEE Trans. Computers, 47 (10): 1124-1135 (1998)A March Test for Functional Faults in Semiconductor Random Access Memories., and . IEEE Trans. Computers, 30 (12): 982-985 (1981)Test Procedures for a Class of Pattern-Sensitive Faults in Semiconductor Random-Access Memories., and . IEEE Trans. Computers, 29 (6): 419-429 (1980)Further Results on Convolutional Codes Derived from Block Codes. Information and Control, 13 (4): 357-362 (October 1968)A Class of High-Rate Double-Error-Correcting Convolutional Codes, , and . Information and Control, 16 (3): 225-230 (May 1970)Stuck-At Tuple-Detection: A Fault Model Based on Stuck-At Faults for Improved Defect Coverage., and . VTS, page 289-295. IEEE Computer Society, (1998)