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Concurrent Error Detection in Nonlinear Digital Circuits Using Time-Freeze Linearization.

, and . IEEE Trans. Computers, 46 (11): 1208-1218 (1997)

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Test generation for specification test of analog circuits using efficient test response observation methods., and . Microelectronics Journal, 36 (9): 820-832 (2005)Concurrent error detection in nonlinear digital filters using checksum linearization and residue prediction., , and . IOLTS, page 53-58. IEEE, (2015)Enhancing Test Effectiveness for Analog Circuits Using Synthesized Measurements., and . VTS, page 132-137. IEEE Computer Society, (1998)Hierarchical Statistical Inference Model for Specification Based Testing of Analog Circuits., , , and . VTS, page 145-151. IEEE Computer Society, (1998)Test Enabled Process Tuning for Adaptive Baseband OFDM Processor., and . VTS, page 9-16. IEEE Computer Society, (2008)ACT: Adaptive Calibration Test for Performance Enhancement and Increased Testability of Wireless RF Front-Ends., , , and . VTS, page 215-220. IEEE Computer Society, (2008)Built-In Test of RF Components Using Mapped Feature Extraction Sensors., and . VTS, page 243-248. IEEE Computer Society, (2005)Low-Cost Alternate EVM Test for Wireless Receiver Systems., and . VTS, page 255-260. IEEE Computer Society, (2005)Test Generation for Accurate Prediction of Analog Specifications., and . VTS, page 137-142. IEEE Computer Society, (2000)Probabilistic Compensation for Digital Filters Using Pervasive Noise-Induced Operator Errors., , and . VTS, page 125-130. IEEE Computer Society, (2007)