Author of the publication

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

High performance thermography with InGaAs photon counting camera., , , and . Microelectronics Reliability, 52 (9-10): 2087-2092 (2012)Magnetic microscopy for 3D devices: Defect localization with high resolution and long working distance on complex system in package., , and . Microelectronics Reliability, 49 (9-11): 1169-1174 (2009)Unsupervised learning for signal mapping in dynamic photon emission., , , , , and . Microelectronics Reliability, 55 (9-10): 1564-1568 (2015)Fault Localization using Time Resolved Photon Emission and STIL Waveforms., , , , , and . ITC, page 254-263. IEEE Computer Society, (2003)Descrambling and data reading techniques for flash-EEPROM memories. Application to smart cards., , , , and . Microelectronics Reliability, 46 (9-11): 1569-1574 (2006)VLSI functional analysis by dynamic emission microscopy., , , and . Microelectronics Reliability, 50 (9-11): 1431-1435 (2010)Facing the defect characterization and localization challenges of bridge defects on a submicronic technology (45 nm and below)., , , , , , , and . Microelectronics Reliability, 50 (9-11): 1499-1505 (2010)Failure Analysis enhancement by evaluating the Photoelectric Laser Stimulation impact on mixed-mode ICs., , , , , and . Microelectronics Reliability, 48 (8-9): 1529-1532 (2008)IR confocal laser microscopy for MEMS Technological Evaluation., , , , and . Microelectronics Reliability, 42 (9-11): 1815-1817 (2002)Light Emission From Small Technologies. Are Silicon Based Detectors Reaching Their Limits?, , , , , , , and . Microelectronics Reliability, 44 (9-11): 1715-1720 (2004)