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Ambient temperature and layout impact on self-heating characterization in FinFET devices.

P. Paliwoda, Z. Chbili, A. Kerber, D. Singh, and D. Misra. IRPS, page 6. IEEE, (2018)

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Ph. D. Durga Dasari University of Stuttgart

Other publications of authors with the same name

Ambient temperature and layout impact on self-heating characterization in FinFET devices.P. Paliwoda, Z. Chbili, A. Kerber, D. Singh, and D. Misra. IRPS, page 6. IEEE, (2018)Interfacial layer quality effects on low-frequency noise (1/f) in p-MOSFETs with advanced gate stacks.P. Srinivasan, F. Crupi, E. Simoen, P. Magnone, C. Pace, D. Misra, and C. Claeys. Microelectronics Reliability, 47 (4-5): 501-504 (2007)Reliability of HfAlOx in multi layered gate stack.M. Bhuyian, and D. Misra. IRPS, page 3. IEEE, (2015)MAPBOT: Meta-analytic parcellation based on text, and its application to the human thalamus.R. Yuan, P. Taylor, T. Alvarez, D. Misra, and B. Biswal. NeuroImage, (2017)Temperature dependent time-to-breakdown (TBD) of TiN/HfO2 n-channel MOS devices in inversion.N. Chowdhury, X. Wang, G. Bersuker, C. Young, N. Rahim, and D. Misra. Microelectronics Reliability, 49 (5): 495-498 (2009)Screening of Hot Electron Effect During Plasma Processing.P. Srinivasan, B. Vootukuru, and D. Misra. VLSI Design, page 291-. IEEE Computer Society, (2004)Voltage and current stress induced variations in TiN/HfSixOy/TiN MIM capacitors.D. Misra, J. Kasinath, and A. Chandorkar. Microelectronics Reliability, 53 (2): 270-273 (2013)Wide Bandgap Materials for Semiconductor Devices.K. Lee, C. Liu, and D. Misra. Microelectronics Reliability, (2018)Degradation Of Nmosfets During High-Field Injection With Reverse Biased Voltage At Source And Drain Junctions.R. Jarwal, and D. Misra. VLSI Design, page 485-490. IEEE Computer Society, (2001)A Synthesizable VHDL Model of the Exact Solution for Three-dimensional Hyperbolic Positioning System.R. Bucher, and D. Misra. VLSI Design, 2002 (2): 507-520 (2002)

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Ambient temperature and layout impact on self-heating characterization in FinFET devices.

Please choose a person to relate this publication to

Ph. D. Durga Dasari University of Stuttgart

Other publications of authors with the same name

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PUMA

Disambiguation of "Misra, Durga"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Ambient temperature and layout impact on self-heating characterization in FinFET devices.

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Ph. D. Durga Dasari University of Stuttgart

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Ambient temperature and layout impact on self-heating characterization in FinFET devices.