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Plasma process induced damage detection by fast wafer level reliability monitoring for automotive applications.

, und . Microelectronics Reliability, (2016)

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Univ. -Prof. Dr. Andreas Bulling University of Stuttgart

InvisibleEye. Dataset, (2024)Related to: Tonsen, Marc, Julian Steil, Yusuke Sugano, Andreas Bulling. 2017. InvisibleEye: Mobile Eye Tracking Using Multiple Low-Resolution Cameras and Learning-Based Gaze Estimation. In Proceedings of the ACM on Interactive, Mobile, Wearable and Ubiquitous Technologies (IMWUT) vol. 1, iss. 3, article no. 106. doi: 10.1145/3130971.

Martin Baumann

Martin Schwartz University of Stuttgart

Martin Alvarez University of Stuttgart

Univ. -Prof. Martin Ostermann University of Stuttgart

 

Weitere Publikationen von Autoren mit dem selben Namen

Editorial.. Microelectronics Reliability, 41 (7): 935 (2001)A Case Modelling Language for Process Variant Management in Case-Based Reasoning., , und . Business Process Management Workshops, Volume 256 von Lecture Notes in Business Information Processing, Seite 30-42. Springer, (2015)Industry 4.0 Enabling Smart Air: Digital Transformation at KAESER COMPRESSORS., , , und . Digitalization Cases, Springer, (2019)Learning and Engineering Similarity Functions for Business Recommenders and Clustering., und . AAAI Spring Symposium: Combining Machine Learning with Knowledge Engineering, Volume 2350 von CEUR Workshop Proceedings, CEUR-WS.org, (2019)Training and Re-using Human Experience: A Recommender for More Accurate Cost Estimates in Project Planning., , und . KMIS, Seite 50-60. SciTePress, (2018)Towards an Assistive and Pattern Learning-driven Process Modeling Approach., , , , , und . AAAI Spring Symposium: Combining Machine Learning with Knowledge Engineering, Volume 2350 von CEUR Workshop Proceedings, CEUR-WS.org, (2019)Quality assessment of thin oxides using constant and ramped stress measurements., , , , , , und . Microelectronics Reliability, 41 (7): 1019-1022 (2001)An introduction to fast wafer level reliability monitoring for integrated circuit mass production., und . Microelectronics Reliability, 44 (8): 1209-1231 (2004)Fast wafer level reliability monitoring as a tool to achieve automotive quality for a wafer process., , , , , und . Microelectronics Reliability, (2016)A Collaborative Approach to Maturing Process-Related Knowledge., , , , , , und . BPM, Volume 6336 von Lecture Notes in Computer Science, Seite 343-358. Springer, (2010)