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Test and Design-for-Testability Solutions for 3D Integrated Circuits.

, , , , , and . IPSJ Trans. System LSI Design Methodology, (2014)

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Chip Health Monitoring Using Machine Learning., , , and . ISVLSI, page 280-283. IEEE Computer Society, (2014)Board-Level Functional Fault Identification using Streaming Data., , , , and . VTS, page 1-6. IEEE, (2019)Self-learning and adaptive board-level functional fault diagnosis., , , and . ASP-DAC, page 294-301. IEEE, (2015)Handling Missing Syndromes in Board-Level Functional-Fault Diagnosis., , , , and . Asian Test Symposium, page 73-78. IEEE Computer Society, (2013)Information-theoretic syndrome and root-cause analysis for guiding board-level fault diagnosis., , , and . ETS, page 1-6. IEEE Computer Society, (2013)Information-Theoretic Syndrome Evaluation, Statistical Root-Cause Analysis, and Correlation-Based Feature Selection for Guiding Board-Level Fault Diagnosis., , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 34 (6): 1014-1026 (2015)TSV open defects in 3D integrated circuits: characterization, test, and optimal spare allocation., and . DAC, page 1024-1030. ACM, (2012)Board-Level Functional Fault Diagnosis Using Learning Based on Incremental Support-Vector Machines., , , and . Asian Test Symposium, page 208-213. IEEE Computer Society, (2012)Adaptive Board-Level Functional Fault Diagnosis Using Decision Trees., , , and . Asian Test Symposium, page 202-207. IEEE Computer Society, (2012)On-Chip Droop-Induced Circuit Delay Prediction Based on Support-Vector Machines., , , , and . IEEE Trans. on CAD of Integrated Circuits and Systems, 35 (4): 665-678 (2016)