Author of the publication

Is the Stack Distance Between Test Case and Method Correlated with Test Effectiveness?

, and . EASE '19: Proceedings of the Evaluation and Assessment on Software Engineering, page 189-198. ACM, (2019)
DOI: 10.1145/3319008.3319021

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk., , and . PeerJ PrePrints, (2018)Is Static Analysis Able to Identify Unnecessary Source Code?, , , and . ACM Transactions on Software Engineering and Methodology, 29 (1): 1-23 (2020)Identification of methods with low fault risk, , and . Proceedings of the 40th International Conference on Software Engineering: Companion Proceeedings (ICSE '18), page 390-391. ACM, (2018)Ticket Coverage: Putting Test Coverage into Context., , , and . WETSoM@ICSE, page 2-8. IEEE, (2017)Too trivial to test? An inverse view on defect prediction to identify methods with low fault risk., , and . PeerJ Computer Science, (2019)Evaluation and improvement of automated software test suites. Universität Stuttgart, Stuttgart, Dissertation, (2019)Is the Stack Distance Between Test Case and Method Correlated with Test Effectiveness?, and . EASE '19: Proceedings of the Evaluation and Assessment on Software Engineering, page 189-198. ACM, (2019)Teamscale: tackle technical debt and control the quality of your software., , and . TechDebt@ICSE, page 55-56. IEEE / ACM, (2019)Kann statische Analyse unnützen Code erkennen?, , , and . Software Engineering, volume P-320 of LNI, page 39-40. Gesellschaft für Informatik e.V., (2022)Poster: Identification of Methods with Low Fault Risk, , and . ICSE '18 : Proceedings 2018 IEEE/ACM 40th International Conference on Software Engineering : Companion Proceedings, page 390-391. IEEE, (2018)